Delphi-X Observer metallurgical

 
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Newsletter March 2019

EN | FR | ES | IT | DE | NL

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A new era in materials science

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The latest addition to Euromex’s Delphi-X Observer microscope family is designed for advanced materials science applications

 

The superior optics - Plan to Plan APO - produce images with the highest possible resolving power and contrast. The 25 mm f.o.v. eyepieces and contrast techniques - such as epi brightfield, epi darkfield, polarization, optional brightfield and DIC - enable microscopists to see details they have never seen before

A wide range of contrast techniques

 
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Darkfield: only scattered or diffracted light will appear bright against a dark background

 
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DIC: a microscopic visualization technique that produces 3-dimensional or relief-like images that show height differences in a specimen

 
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Polarization: the use of a polarization filter and cross-polarized filters (polarizer and analyzer) improves the quality of the image obtained with birefringent materials

 
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Transmitted light: this type of contrast technique is ideal for transparent materials such as glass windows, LCD-displays and plastics

A selection of great features 

 
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Sextuple nosepiece with

slot for DIC slider

 
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Brightfield/darkfield Epi illuminator,

100 W halogen light source

 
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Long working distance condenser

(10.2 mm) N.A. 0.65

 
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Ergonomic head (optional)

 
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Eye-level riser (optional)

 
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Nosepiece lowering attachment (optional)

For more information please visit our website, download the brochure and/or product datasheet

If you have any questions please do not hesitate to contact us,

we are looking forward to hearing from you!

Euromex Microscopen bv

 

 E-mail: info@euromex.com

 

 Tel: +31 (0) 26 323 22 11

Euromex Microscopen Spain sl

 

 E-mail: info@euromex.com


Tel: +34 (0) 937 415 609

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